Jaehyek Choi Embedded/Firmware Engineer

eMMC UFS Issues 01

2016-12-22
Jaehyek

Component Feature

  • 8GB eMCP, TLC
  • Controller : VPX
  • SS

Failure Symptom

  • Can not perform the emmc command “CMD23”

Failure procedure

  1. Known data write
  2. ( random write 4K x 3500 times  Sleep  Resume) x 50K times
  3. UECC check
  4. Sequential write

Cause

  • was caused by EOL ( End of Life) 001
  • was caused by frequently Random Write
  • was caused by frequently MetaData Update 002 003

SS Quality Criteria

Test Pattern of DWL @ Samsung(Write Amount Ratio)

Classification Chunk Size Write Amount Ratio
Random Write 4K/8K 5%
Seq Write 16K/32K~4M 35%
Download 4M 60%

WAI(Wear Acceleration Index) – Index which indicate Meta lifespan by host write amount

item WAI with Samsung TBW Pattern WAI with 4K Random Write Pattern
SLC WAI 0.28 22.96

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